Nanoepitaxy of SnO2 on α-Al2O3(0 1 2)

Surface Science

Volumn 532-535, Issue , 2003, Pages 514-518

  Tarre, A ^a   Rosental, A ^a   Sundqvist, J ^b   Harsta A ^b   Uustare, T ^a   Sammelselg, V ^a  

^a UNIVERSITY OF TARTU   (Estonia)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

Aluminum oxide; Atomic force microscopy; Epitaxy; Halides; Oxygen; Reflection high energy electron diffraction (RHEED); Tin oxides; X ray scattering, diffraction, and reflection

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; CHEMICAL VAPOR DEPOSITION; CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; GASES; NANOSTRUCTURED MATERIALS; OXYGEN; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; ULTRATHIN FILMS; X RAY DIFFRACTION ANALYSIS;

NANOEPITAXY;

TIN COMPOUNDS;

EID: 0037508597     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00476-X     Document Type: Conference Paper

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