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Volumn 133, Issue 1-4, 2000, Pages 119-123
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Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy
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Author keywords
Atomic force microscopy (AFM); Atomic layer epitaxy (ALE); Cross sectional AFM (X AFM); Gas sensor; Heteroepitaxy; Tin dioxide
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Indexed keywords
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EID: 0000502719
PISSN: 00263672
EISSN: None
Source Type: Journal
DOI: 10.1007/s006040070080 Document Type: Article |
Times cited : (29)
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References (20)
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