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Volumn 133, Issue 1-4, 2000, Pages 119-123

Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy

Author keywords

Atomic force microscopy (AFM); Atomic layer epitaxy (ALE); Cross sectional AFM (X AFM); Gas sensor; Heteroepitaxy; Tin dioxide

Indexed keywords


EID: 0000502719     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040070080     Document Type: Article
Times cited : (29)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.