Effect of step function-like perturbation on intermittent contact mode sensors: A response analysis

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 123-127

  Kokavecz, János ^a   Heszler, Péter ^b,c   Tóth, Zsolt ^b   Mechler, Ádám ^b,d  

^a UNIVERSITY OF SZEGED   (Hungary)

^b RESEARCH GROUP ON LASER PHYSICS   (Hungary)

^c UPPSALA UNIVERSITY   (Sweden)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Fast scanning atomic force microscopy; Intermittent contact mode; Numerical simulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CONTACT SENSORS; PIEZOELECTRIC DEVICES; PROBES;

INTERMITTENT CONTACT MODE (ICM);

SURFACE PHENOMENA;

EID: 0037474590     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01491-5     Document Type: Conference Paper

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