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Volumn 66, Issue SUPPL. 1, 1998, Pages

Lateral force microscope and phase imaging of patterned thiol self-assembledmonolayer using chemically modified tips

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICALLY MODIFIED TIPS; DIFFERENT DOMAINS; GOLD-COATED; LATERAL FORCE MICROSCOPES; LATERAL FORCE MICROSCOPY; PHASE IMAGING; SI SUBSTRATES;

EID: 0000118789     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051342     Document Type: Article
Times cited : (25)

References (15)
  • 14
    • 0003692711 scopus 로고
    • ed. by H.-J. Güntherodt D. Anselmetti, E. Meyer, (NATO ASI Series)
    • O. Marti, J. Colchero, in Forces in Scanning Probe Methods, ed. by H.-J. Güntherodt, D. Anselmetti, E. Meyer, (NATO ASI Series 1995), p.15
    • (1995) Forces in Scanning Probe Methods , pp. 15
    • Marti, O.1    Colchero, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.