Degenerate layer at GaN/sapphire interface: Influence on Hall-effect measurements

Applied Physics Letters

Volumn 70, Issue 25, 1997, Pages 3377-3379

  Look, D C ^a   Molnar, R J ^b  

^a WRIGHT STATE UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001638296     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119176     Document Type: Article

References (17)

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