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Volumn 250, Issue 3-4, 2003, Pages 298-304
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Growth of SiGe bulk crystals with uniform composition by utilizing feedback control system of the crystal-melt interface position for precise control of the growth temperature
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Author keywords
A1. Control of growth temperature; A1. Feedback control; A1. In situ monitoring; A2. Growth from melt; B1. Germanium silicon alloys; B1. Multicomponent substrate for heterostructures
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Indexed keywords
FEEDBACK CONTROL;
LATTICE CONSTANTS;
PHASE DIAGRAMS;
SILICON ALLOYS;
IN SITU MONITORING;
CRYSTAL GROWTH FROM MELT;
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EID: 0037399523
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)02400-4 Document Type: Conference Paper |
Times cited : (33)
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References (16)
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