Diode laser testing by taking advantage of its photoelectric properties

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4648, Issue , 2002, Pages 9-21

  Tomm, J W ^a   Gerhardt, A ^a   Lorenzen, Dirk ^b   Hennig, P ^b   Roehle, H ^c  

^a MAX BORN INSTITUT   (Germany)

^b JENOPTIK Laserdiode GmbH   (Germany)

^c FRAUNHOFER HEINRICH HERTZ INSTITUTE   (Germany)

Author keywords

Diode laser reliability; LBIC; Photocurrent

Indexed keywords

LIGHT EMISSION; PHOTOCURRENTS; PHOTONS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; STRESSES;

PHOTOCURRENT SPECTROSCOPY;

SEMICONDUCTOR LASERS;

EID: 0036031461     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.462652     Document Type: Article

References (20)

1. 1-xAs double heterostructure laser material" J. Appl. Phys. 50, 3721-32, 1979.
2. J. Nelson, M. Paxman, K.W.J. Barnham, J.S. Roberts, and C. Button "Steady state carrier escape from single quantum wells" IEEE J. Quant. El. 29, 1460-8 (1993).
3. K.H. Herrmann, Hessa Al-Otaibi, and J.W. Tomm "Photocurrent spectroscopy of QW GRIN laser structures" Material Science and Engineering B74, 61-65 (2000).
4. J.W. Tomm, R. Müller, A. Bärwolff, T. Elsaesser, D. Lorenzen, F.X. Daiminger, A. Gerhardt, and J. Donecker "Direct spectroscopic measurement of thermally induced strain in high-power optoelectronic devices" Appl. Phys. Lett. 73, 3908-3910 (1998).
5. J.W. Tomm, A. Bärwolff, U. Menzel, M. Voß, R. Puchert, and T. Elsaesser F.X. Daiminger, S. Heinemann and J. Luft, "Monitoring of Aging Properties of AlGaAs High-Power Laser Arrays" J. Appl. Phys. 81, 2059-63 (1997).
6. J.W. Tomm, A. Jaeger, A. Bärwolff, T. Elsaesser, A. Gerhardt, and J. Donecker, "Aging Properties of High Power Laser Diode Arrays Analyzed by Fourier-Transform Photo-Current Measurements" Appl. Phys. Lett. 71, 2233-5 (1997).
7. C.J.R. Sheppard "Scanning optical microscopy of semiconductor materials and devices" Scanning Microscopy 3 15-24 (1989).
8. J. Jimenez, M.A. Gonzalez, L.F. Sanz, L.R. de Angelo, and J. Bonnafe "Low-temperature spatially resolved photoconductivity in semi-insulating GaAs" Semicond. Sci. Technol. 7 A202-6 (1992).
9. J.W. Tomm, A. Bärwolff, A. Jaeger, T. Elsaesser, J. Bollmann, W.T. Masselink, A. Gerhard, and J. Donecker, "Deep level spectroscopy of high-power laser diode arrays" J. Appl. Phys. 84, 1325-32 (1998).
10. J.W. Tomm, A. Bärwolff, T. Elsaesser, and J. Luft, "Selective excitation and photoinduced bleaching of defects in InAlGaAs/GaAs high-power diode lasers" Appl. Phys. Lett. 77, 747-749 (2000).
11. T. Guenther, V. Malyarchuk, J.W. Tomm, R. Mueller, C. Lienau, and J. Luft, "Near-Field Photocurrent Imaging of the Optical Mode Profiles of Semiconductor Laser Diodes" Appl. Phys. Lett. 78 1463-1465 (2001).
12. A. Richter, J.W. Tomm, Ch. Lienau and J. Luft "Optical Near-Field Photocurrent Spectroscopy - a new Technique for Analyzing Microscopic Aging Processes in Optoelectronic Devices" Appl. Phys. Lett. 69, 3981-3 (1996).
13. E. Suhir: "Calculated thermally induced stress in adhesively bonded and soldered assemblies", Proc. ISHM 1986, 383-392 (1986).
14. R.P. Reed, C.N. McCowan, R.P. Walsh, L.A. Delgado and J.D. McColskey: "Tensile strength and ductility of indium", Materials Science and Engineering A 102, 227-336 (1988).
15. M. Plötner, B. Donat and A. Benke: "Deformation properties of indium-based solders at 294 and 77 K", Cryogenics 31, 159-162 (1991).
16. J.W. Tomm, A. Gerhardt J.-P. Landesman P. Galtier, Y. Sainte-Marie, J. Nagle "Spatially-resolved spectroscopic strain measurements at high-power diode laser bars" submitted to CLEO Conference (2002).
17. A. Gerhardt, J.W. Tomm, A. Bärwolff, D. Lorenzen, and J. Donecker; "Measurement of mounting-induced and grown-in strain in high-power laser diodes using Fourier-transform photo-current spectroscopy Materials" in print in Materials, Science and Engineering B (2002).
18. J.W. Tomm and A. Bärwolff "Aging properties of 840 nm ion-implanted VCSEL's monitored by analysis of their photoelectric properties" SPIE Proc. 3946, 30-35 (2000).
19. A. Jaeger, P.M. Petroff, and T.D. Lowes "Angle-dependent photocurrent spectroscopy of oxide-apertured vertical-cavity surface-emitting lasers during aging" Appl. Phys. Lett. 78, 3012-4 (2001).
20. J.W. Tomm, T. Günther, Ch. Lienau, A. Gerhardt, and J. Donecker, "Near-field Photocurrent Spectroscopy of Laser Diode Devices" J. Cryst. Growth 210, 296-302 (2000).