In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution X-ray diffraction and topography using synchrotron radiation

Journal of Physics D: Applied Physics

Volumn 32, Issue 10 A, 1999, Pages

  Zeimer, U ^a   Baumbach, T ^b   Grenzer, J ^c   Lubbert D ^b   Mazuelas, A ^d   Pietsch, U ^c   Erbert, G ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^b FRAUNHOFER INSTITUTE FOR NON DESTRUCTIVE TESTING   (Germany)

^c UNIVERSITY OF POTSDAM   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DEGRADATION; SEMICONDUCTOR LASERS; STRAIN MEASUREMENT; SURFACE TOPOGRAPHY; SYNCHROTRON RADIATION; TEMPERATURE DISTRIBUTION;

HIGH RESOLUTION X RAY DIFFRACTION; STRAIN DISTRIBUTION; THERMAL LATTICE EXPANSION;

X RAY DIFFRACTION ANALYSIS;

EID: 0032642473     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/10A/326     Document Type: Article

References (5)

1. Petersen A B and Nighan W L 1998 Proc. Conf. on Lasers and Electro-Optics (CLEO 98) (1998 OSA Technical Digest Series 6) p 545
2. Kaplan P D, Crocker J C and Weitz D 1998 Proc. Conf. on Lasers and Electro-Optics (CLEO 98) (1998 OSA Technical Digest Series 6) pp 205-6
3. Erbert G, Oster A, Sebastian J, Staske R, Vogel K, Wenzel H, Weyers M and Tränkle G 1997 Conf. Proc. 10th Annual Meeting of the IEEE Lasers and Electro-Optics Society vol 2, pp 199-200
4. Bugge F, Beister G, Erbert G, Gramlich S, Vogel K, Zeimer U and Weyers M 1997 Inst. Phys. Conf. Series 155 573-6
5. Mazuelas A, Milita S, Härtwig J, Baruchel J, Baumbach T, Bellet D, Frouin J and Capelle B Proc. First Meeting of the French-Spanish Group on Materials Science (Grenoble 97)