Electronic structure of monolayer and double-layer Ge on Si(001)

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 8, 2003, Pages

  Yeom, H W ^a   Kim, J W ^a   Tono, K ^b   Matsuda, I ^b   Ohta, T ^b  

^a Yonsei University   (South Korea)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; GERMANIUM; SILICON;

ARTICLE; MEASUREMENT; RADIATION; STOICHIOMETRY; STRUCTURE ANALYSIS; SURFACE PROPERTY; SYNCHROTRON;

EID: 0037304798     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.085310     Document Type: Article

References (36)

1. For example, T E. Whall and E H C. Parker, J. Mater. Sci.: Mater. Electron6, 249 (1995).
2. M. Asai, H. Ueda, and C. Tatsuyama, J. Appl. Phys.58, 2577 (1985);
3. H.-J. Gossmann, L C. Feldman, and W M. Gibson, Surf. Sci.155, 413 (1985).
4. F. Liu, F. Wu, and M G. Lagally, Chem. Rev.97, 1045 (1997), and references therein.
5. D J. Eaglesham and M. Cerullo, Phys. Rev. Lett.64, 1943 (1990);
6. Phys. Rev. Lett.Y.-W. Mo, D E. Savage, B S. Swartzentruber, and M G. Lagally, 65, 1020 (1990).
7. T I. Kamins, K. Nauka, and R S. Williams, Appl. Phys. A: Mater. Sci. Process.73, 1 (2001).
8. M. Copel, M C. Reuter, M. Horn von Hoegen, and R M. Tromp, Phys. Rev. B42, 11 682 (1990);
9. S S. Iyer, J C. Tsang, M W. Copel, P R. Pukite, and R M. Tromp, Appl. Phys. Lett.54, 219 (1989).
10. F. Iwakami, M. Tomitori, and O. Nishikawa, Surf. Sci.266, 285 (1992);
11. F. IwakamiM. TomitoriO. NishikawaUltramicroscopy42, 895 (1992).
12. E. Fontes, J R. Patel, and F. Comin, Phys. Rev. Lett.70, 2790 (1993), and references therein.
13. J.-H. Cho, S.-M. Jeong, and M.-H. Kang, Phys. Rev. B50, 17 139 (1994);
14. Phys. Rev. BJ.-M. Jin and L J. Lewis, 49, 2201 (1994).
15. L. Patthey, E L. Bullock, T. Abukawa, S. Kono, and L S O. Johansson, Phys. Rev. Lett.75, 2538 (1995).
16. H W. Yeom, M. Sasaki, S. Suzuki, S. Sata, S. Hosoi, M. Iwabuchi, K. Higashiyama, F. Fukutani, M. Nakamura, T. Abukawa, and S. Kono, Surf. Sci. Lett.381, L533 (1997).
17. A. Ikeda, K. Sumitomo, T. Nishioka, T. Yause, and Y. Kido, Surf. Sci.385, 200 (1997);
18. K. Nakajima, A. Konishi, and K. Kimura, Phys. Rev. Lett.83, 1802 (1999).
19. B P. Uberuaga, M. Leskovar, A P. Smith, H. Jonsson, and M. Olmstead, Phys. Rev. Lett.84, 2441 (2000).
20. S J. Jenkins and G P. Srivastava, Surf. Sci.377–379, 887 (1997);
21. Surf. Sci.Y. Yoshimoto and M. Tsukada, 423, 32 (1999).
22. X R. Qin, B S. Swartzentruber, and M G. Lagally, Phys. Rev. Lett.84, 4645 (2000).
23. X Y. Zhu and Y H. Lee, Phys. Rev. B59, 9764 (1999).
24. X. Chen, D K. Saldin, E L. Bullock, L. Patthey, L S O. Johansson, J. Tani, T. Abukawa, and S. Kono, Phys. Rev. B55, R7319 (1997).
25. S C A. Gay and G P. Strivastava, Surf. Sci.433–435, 909 (1999).
26. T. Abukawa and S. Kono, Phys. Rev. B37, 9097 (1988);
27. T. Abukawa, T. Okane, and S. Kono, Surf. Sci.256, 370 (1991).
28. L S O. Johansson, R I G. Uhrberg, P. Martensson, and G V. Hansson, Phys. Rev. B42, 1305 (1990).
29. P. Krüger and J. Pollmann, Appl. Phys. A: Mater. Sci. Process.59, 487 (1994).
30. E. Landemark, R I G. Uhrberg, P. Kruger, and J. Pollmann, Surf. Sci. Lett.236, L359 (1990);
31. E. Landemark, C J. Karlsson, L S O. Johansson, and R I G. Uhrberg, Phys. Rev. B49, 16 523 (1994).
32. P. Krüger and J. Pollmann, Phys. Rev. Lett.74, 1155 (1995).
33. Y. Enta, S. Suzuki, and S. Kono, Phys. Rev. Lett.65, 2704 (1990).
34. K C. Low and C K. Ong, Phys. Rev. B50, 5352 (1994);
35. Phys. Rev. BJ E. Northrup, 47, 10 032 (1993).
36. J.-H. Ku and R J. Nemanich, Phys. Rev. B54, 14 102 (1996).