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Volumn 59, Issue 15, 1999, Pages 9764-9767

Defect-induced si/ge intermixing on the ge/si(100) surface

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Indexed keywords


EID: 0000239342     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.9764     Document Type: Article
Times cited : (9)

References (37)
  • 17
    • 0001374666 scopus 로고    scopus 로고
    • For, -point sampling dependence, for instance, see the paper by, and
    • For k-point sampling dependence, for instance, see the paper by T. Yamasaki, T. Uda, and K. Terakura, Phys. Rev. Lett.76, 2949 (1996).
    • (1996) Phys. Rev. Lett. , vol.76 , pp. 2949
    • Yamasaki, T.1    Uda, T.2    Terakura, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.