Direct observation of intermixing at Ge/Si(001) interfaces by high–resolution rutherford backscattering spectroscopy

Physical Review Letters

Volumn 83, Issue 9, 1999, Pages 1802-1805

  Nakajima, Kaoru ^a   Konishi, Atsushi ^a   Kimura, Kenji ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000938131     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.1802     Document Type: Article

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