메뉴 건너뛰기




Volumn 23, Issue 2, 2003, Pages 247-251

Metallorganic chemical vapor deposition of Ta2O5 films

Author keywords

CVD; Dielectric properties; Films; Ta2O5

Indexed keywords

FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; REFRACTIVE INDEX; SOLUTIONS;

EID: 0037292199     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(02)00184-X     Document Type: Article
Times cited : (29)

References (18)
  • 5
    • 0034341781 scopus 로고    scopus 로고
    • A fiber optic wavelength modulation sensor based on tantalum pentoxide coatings for absolute temperature measurements
    • (2000) Opt. Rev , vol.7 , Issue.3 , pp. 205-208
    • Inci, M.N.1    Yoshino, T.2
  • 16
  • 18
    • 0032652998 scopus 로고    scopus 로고
    • Conversion efficiency of alkoxide precursor to oxide films grown by an ultrasonic-assisted, pulsed liquid injection, metalorganic chemical vapor deposition (Pulsed-CVD) process
    • (1999) J. Am. Ceram. Soc , vol.82 , Issue.6 , pp. 1605-1607
    • Krumdieck, S.1    Raj, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.