New techniques for efficiently assessing reliability of SOCs

Microelectronics Journal

Volumn 34, Issue 1, 2003, Pages 53-61

  Civera, P ^a   Macchiarulo, L ^a   Rebaudengo, M ^a   Sonza Reorda, M ^a   Violante, M ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Fault Injection; Single Event Upset; System On a Chip

Indexed keywords

DIGITAL STORAGE; FAULT TOLERANT COMPUTER SYSTEMS; MICROELECTRONICS; MICROPROCESSOR CHIPS; RELIABILITY;

FAULT INJECTION;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0037238762     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(02)00127-1     Document Type: Conference Paper

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