A modeling and convolution method to measure compositional variations in strained alloy quantum dots

Ultramicroscopy

Volumn 94, Issue 1, 2003, Pages 1-18

  Crozier, P A ^a   Catalano, Massimo ^b   Cingolani, R ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b CNR   (Italy)

^c INFM   (Italy)

Author keywords

Convolution; Electron energy loss spectroscopy; InGaAs; Probe shape; Quantum dot; Spatially resolved spectroscopy

Indexed keywords

CONVOLUTION; ELECTRON ENERGY LOSS SPECTROSCOPY; GALLIUM ALLOYS; MATHEMATICAL MODELS; SCANNING; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; WETTING;

NANOMETERS;

SEMICONDUCTOR QUANTUM DOTS;

ALLOY; ARSENIC; GALLIUM ARSENIDE; INDIUM;

ARTICLE; CHEMICAL COMPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON PROBE MICROANALYSIS; METHODOLOGY; MODEL; PREDICTION; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR; SIMULATION;

EID: 0037212009     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00158-4     Document Type: Article

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