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Volumn 79, Issue 19, 2001, Pages 3170-3172

Direct quantitative measurement of compositional enrichment and variations in InyGa1-yAs quantum dots

b CNR (Italy)

c INFM (Italy)

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[No Author keywords available]

Indexed keywords

EID: 0001563563 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1415414 Document Type: Article

Times cited : (24)

References (16)

1
- 0032620409
- V. M. Ustinov, N. A. Maleev, A. E. Zhukov, A. R. Kovsh, A. Yu. Egorov, A. V. Lunev, B. V. Volovik, I. L. Krestnikov, Yu. G. Musikhin, N. A. Bert, P. S. Kop'ev, Zh. I. Alferov, N. N. Ledentsov, and D. Bimberg, Appl. Phys. Lett. 74, 2815 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 2815
- Ustinov, V.M.¹ Maleev, N.A.² Zhukov, A.E.³ Kovsh, A.R.⁴ Egorov, A.Yu.⁵ Lunev, A.V.⁶ Volovik, B.V.⁷ Krestnikov, I.L.⁸ Musikhin, Yu.G.⁹ Bert, N.A.¹⁰ Kop'ev, P.S.¹¹ Alferov, Zh.I.¹² Ledentsov, N.N.¹³ Bimberg, D.¹⁴

2
- 0033521831
- J. W. Gray, D. Childs, S. Malik, P. Siverns, C. Roberts, P. N. Stavrinou, M. Whitehead, R. Murray, and G. Parry, Electron. Lett. 35, 242 (1999).
- (1999) Electron. Lett. , vol.35 , pp. 242
- Gray, J.W.¹ Childs, D.² Malik, S.³ Siverns, P.⁴ Roberts, C.⁵ Stavrinou, P.N.⁶ Whitehead, M.⁷ Murray, R.⁸ Parry, G.⁹

3
- 0342779775
- F. Schafer, J. P. Reithmaier, and A. Forchel, Appl. Phys. Lett. 74, 2915 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 2915
- Schafer, F.¹ Reithmaier, J.P.² Forchel, A.³

4
- 0035871184
- A. Passaseo, A. L. Convertino, M. Longo, R. Rinaldi, S. Antonaci, R. Cingolani, A. Taurino, and M. Catalano, J. Appl. Phys. 89, 4341 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 4341
- Passaseo, A.¹ Convertino, A.L.² Longo, M.³ Rinaldi, R.⁴ Antonaci, S.⁵ Cingolani, R.⁶ Taurino, A.⁷ Catalano, M.⁸

5
- 0032686563
- A. Endoh, Y. Nakata, Y. Sugiyama, M. Takatsu, and N. Yokoyama, Jpn. J. Appl. Phys., Part 1 38, 1085 (1999).
- (1999) Jpn. J. Appl. Phys., Part 1 , vol.38 , pp. 1085
- Endoh, A.¹ Nakata, Y.² Sugiyama, Y.³ Takatsu, M.⁴ Yokoyama, N.⁵

6
- 0011933305
- M. Catalano, A. Taurino, M. Lomascolo, L. Vasanelli, M. De Giorgi, A. Passaseo, R. Rinaldi, R. Cingolani, O. Mauritz, G. Goldoni, F. Rossi, E. Molinari, and P. Crozier, J. Appl. Phys. 87, 2261 (2000).
- (2000) J. Appl. Phys. , vol.87 , pp. 2261
- Catalano, M.¹ Taurino, A.² Lomascolo, M.³ Vasanelli, L.⁴ De Giorgi, M.⁵ Passaseo, A.⁶ Rinaldi, R.⁷ Cingolani, R.⁸ Mauritz, O.⁹ Goldoni, G.¹⁰ Rossi, F.¹¹ Molinari, E.¹² Crozier, P.¹³

7
- 0001309567
- B. Lita, R. S. Goldman, J. D. Philips, and P. K. Bhattacharya, Appl. Phys. Lett. 75, 2797 (1999).
- (1999) Appl. Phys. Lett. , vol.75 , pp. 2797
- Lita, B.¹ Goldman, R.S.² Philips, J.D.³ Bhattacharya, P.K.⁴

8
- 0001037809
- D. Zhi, H. Davock, R. Murray, C. Roberts, T. S. Jones, D. W. Pashley, P. J. Goodhew, and B. A. Joyce, J. Appl. Phys. 89, 2079 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 2079
- Zhi, D.¹ Davock, H.² Murray, R.³ Roberts, C.⁴ Jones, T.S.⁵ Pashley, D.W.⁶ Goodhew, P.J.⁷ Joyce, B.A.⁸

9
- 0000123224
- N. Liu, J. Tersoff, O. Baklenov, A. L. Holmes, and C. K. Shih, Phys. Rev. Lett. 84, 334 (2000).
- (2000) Phys. Rev. Lett. , vol.84 , pp. 334
- Liu, N.¹ Tersoff, J.² Baklenov, O.³ Holmes, A.L.⁴ Shih, C.K.⁵

10
- 0035809581
- A. Passaseo, G. Maruggio, M. De Vittorio, R. Rinaldi, R. Cingolani, and M. Lomascolo, Appl. Phys. Lett. 78, 1382 (2001).
- (2001) Appl. Phys. Lett. , vol.78 , pp. 1382
- Passaseo, A.¹ Maruggio, G.² De Vittorio, M.³ Rinaldi, R.⁴ Cingolani, R.⁵ Lomascolo, M.⁶

11
- 0003394101
- Plenum, New York
- R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986).
- (1986) Electron Energy-Loss Spectroscopy in the Electron Microscope
- Egerton, R.F.¹

12
- 0041753687
- in press
- P. A. Crozier and M. Catalano, Ultramicroscopy (in press).
- Ultramicroscopy
- Crozier, P.A.¹ Catalano, M.²

13
- 0023467788
- G. Chew and A. G. Cullis, Ultramicroscopy 23, 175 (1987).
- (1987) Ultramicroscopy , vol.23 , pp. 175
- Chew, G.¹ Cullis, A.G.²

14
- 0019728711
- J. Hosoi, T. Oikawa, M. Inouem, Y. Kokubo, and K. Hama, Ultramicroscopy 7, 147 (1981).
- (1981) Ultramicroscopy , vol.7 , pp. 147
- Hosoi, J.¹ Oikawa, T.² Inouem, M.³ Kokubo, Y.⁴ Hama, K.⁵

15
- 0001816915
- San Francisco, San Francisco
- R. F. Egerton, 50th Ann. Proc. Electron Microsc. Soc. Amer. (San Francisco, San Francisco, 1992), p. 1264.
- (1992) 50th Ann. Proc. Electron Microsc. Soc. Amer. , pp. 1264
- Egerton, R.F.¹

16
- 11544252590
- J. Tersoff, Phys. Rev. Lett. 81, 3183 (1998).
- (1998) Phys. Rev. Lett. , vol.81 , pp. 3183
- Tersoff, J.¹

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