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Volumn 413, Issue 1-2, 2002, Pages 59-64
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Local structure and bonds of amorphous silicon oxynitride thin films
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Author keywords
Plasma processing and deposition; Silicon nitride; Silicon oxide; Structural properties
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Indexed keywords
AMORPHOUS FILMS;
CHEMICAL BONDS;
COMPOSITION EFFECTS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MATHEMATICAL MODELS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SILICON NITRIDE;
X RAY ANALYSIS;
LOCAL STRUCTURE;
THIN FILMS;
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EID: 0037166605
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(02)00346-2 Document Type: Article |
Times cited : (45)
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References (44)
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