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Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 24, 2002, Pages 2453051-2453057

Scattering lifetimes due to interface roughness with large lateral correlation length in AlxGa1-xN/GaN two-dimensional electron gas

(7) Tang, H a Webb, J B a Coleridge P a Bardwell, J A a Ko, C H b Su, Y K b Chang, S J b

a NATIONAL RESEARCH COUNCIL CANADA (Canada)

b NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; GALLIUM; NITROGEN;

ARTICLE; CALCULATION; CORRELATION FUNCTION; CRYSTAL; ELECTRON; GAS; MATHEMATICAL ANALYSIS; NEUTRON SCATTERING; PARTICLE SIZE; QUANTUM MECHANICS; RADIATION SCATTERING; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 0037116149 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (14)

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