Changes of contact potential difference induced by frictional damage in ultrahigh vacuum

Materials Research Society Symposium - Proceedings

Volumn 558, Issue , 2000, Pages 161-166

  Zhang, L ^a   Nakayama, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTROSTATICS; METALS; SURFACE TOPOGRAPHY;

CONTACT POTENTIAL DIFFERENCE; OPTICAL DEFLECTION DETECTION SYSTEM; SCANNING KELVIN PROBE FORCE MICROSCOPE;

SEMICONDUCTOR MATERIALS;

EID: 0033702247     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)