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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 24, 2002, Pages 2453241-24532411

Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction

(8) Roch, T a Holy V a,c Hesse, A a Stangl, J a Fromherz, T a Bauer, G a Metzger, T H b Ferrer, S b

a JOHANNES KEPLER UNIVERSITY LINZ (Austria)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c MASARYK UNIVERSITY (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; CALCULATION; ELASTICITY; MATHEMATICAL ANALYSIS; MEASUREMENT; NANOPARTICLE; PHOTOLUMINESCENCE; SEMICONDUCTOR; SIMULATION; SPACE; X RAY DIFFRACTION;

EID: 0037098438 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.65.245324 Document Type: Article

Times cited : (17)

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