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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 20, 2001, Pages 2053181-2053185

Grazing incidence small-angle x-ray scattering study of self-orgnized SiGe wires

(9) Holy V a Roch, T a Stangl, J a Daniel, A a Bauer, G a,d Metzger, T H b Zhu, Y H c Brunner, K c Abstreiter, G c

a JOHANNES KEPLER UNIVERSITY LINZ (Austria)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c WALTER SCHOTTKY INSTITUT (Germany)

d MASARYK UNIVERSITY (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; FOURIER TRANSFORMATION; GEOMETRY; MATHEMATICAL ANALYSIS; QUANTUM THEORY; RADIATION SCATTERING; SEMICONDUCTOR; STRUCTURE ANALYSIS; X RAY; X RAY DIFFRACTION;

EID: 0034900331 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (21)

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