Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 3, 2000, Pages 2173-2179

  Giannini, C ^a   Baumbach, T ^a   Lubbert D ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000804837     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.2173     Document Type: Article

References (27)

1. Strained Layer Epitaxy—Materials, Processing and Device Applications, edited by E. A. Fitzgerald, J. Hoyt, K.-Y. Cheng, and J. Bean, MAS Symposia Proceedings No. 379 (Materials Research Society, Pittsburgh, 1995), and references therein.
2. A. G. Cullis, B. J. Robbins, A. J. Pidduck, and P. W. Smith, in Evolution of Surface and Thin Film Microstructure, edited by H. A. Atwater et al., MRS Symposia Proceedings No. 280 (Materials Research Society, Pittsburgh, 1993), p. 383.
3. A. G. Cullis, in Evolution of Epitaxial Structure and Morphology, edited by A. Zangwill et al., MRS Symposia Proceedings No. 399 (Materials Research Society, Pittsburgh, 1996), p. 303.
4. M. Albrecht, S. Christiansen, J. Michler, W. Dorsch, H. P. Strunk, P. O. Hansson, and E. Bauser, Appl. Phys. Lett. 67, 1232 (1995).
5. Y.-W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, Phys. Rev. Lett. 65, 1020 (1990).
6. D. J. Eaglesham and M. Cerullo, Phys. Rev. Lett. 64, 1943 (1990).
7. F. K. LeGoues, M. C. Reuter, J. Tersoff, M. Hammar, and R. M. Tromp, Phys. Rev. Lett. 73, 300 (1994).
8. W. Dorsch, S. Christiansen, M. Albrecht, P. O. Hansson, E. Bauser, and H. P. Strunk, Surf. Sci. 331-333, 896 (1994).
9. W. Dorsch, B. Steiner, M. Albrecht, H. P. Strunk, H. Wawra, and G. Wagner, J. Cryst. Growth 183, 305 (1998).
10. B. G. Orr, D. Kessler, C. W. Snyder, and L. Sander, Europhys. Lett. 19, 33 (1992).
11. A. Ponchet, A. Rocher, J.-Y. Emery, C. Starck, and L. Goldstein, J. Appl. Phys. 74, 3778 (1993).
12. A. Ponchet, A. Rocker, A. Ougazzaden, and A. Mircea, J. Appl. Phys. 75, 7881 (1994).
13. T. Marschner, S. Lutgen, M. Volk, W. Stolz, E. O. Göbel, N. Y. Jin-Phillipp, and F. Phillipp, Superlattices Microstruct. 15, 183 (1994).
14. T. Marschner, L. Tapfer, N. Y. Jin-Phillipp, F. Phillipp, S. Lutgen, M. Volk, W. Stolz, and E. O. Göbel, Solid-State Electron. 40, 819 (1996).
15. S. Lugten, T. Marschner, W. Stolz, E. O. Göbel, and L. Tapfer, J. Cryst. Growth 152, 1 (1995).
16. F. Comin, R. de Martino, K. Fesca, V. Formoso, L. Ortega, and R. Signorato, J. Phys. IV 7, 343 (1997).
17. F. Comin, L. Ortega, V. Caiehol, V. Formoso, R. de Martino, and K. Fesca, J. Phys. IV 7, 345 (1997).
18. D. K. Bowen and B. K. Tanner, High Resolution X-Ray Diffractometry and Topography (Taylor and Francis, London, 1998).
19. V. Holy, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering From Thin Films and Multilayers, Springer Tracts in Modern Physics No. 149 (Springer, New York, 1998), and references therein.
20. A. P. Payne and B. M. Clemens, Phys. Rev. B 47, 2289 (1993).
21. V. Holy and T. Baumbach, Phys. Rev. B 49, 10 668 (1994).
22. T. Baumbach and D. Luebbert, J. Phys. D 32, 726 (1999).
23. H. Dosch, Phys. Rev. B 35, 2137 (1987).
24. G. T. Baumbach and M. Gaihanou, J. Phys. D 28, 2321 (1995).
25. G. T. Baumbach, C. Giannini, D. Lübbert, R. Felici, L. Tapfer, T. Marschner, and W. Stolz, J. Phys. D 32, A212 (1999).
26. C. Giannini, L. Tapfer, Y. Zhuang, L. De Caro, T. Marschner, and W. Stolz, Phys. Rev. B 55, 5276 (1997).
27. F. Liu, J. Tersoff, and M. G. Lagally, Phys. Rev. Lett. 80, 1268 (1998).