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Volumn 65, Issue 3, 2002, Pages 353111-353118

Surface transport kinetics in low-temperature silicon deposition determined from topography evolution

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; GLASS; HELIUM; HYDROGEN; SILANE; SILICON;

EID: 0037080625     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (62)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.