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Volumn 149, Issue 2-3, 2002, Pages 135-142

A molecular dynamics study of deposition rate dependence of film morphology in the sputtering process

Author keywords

Deposition rate; Incident energy; Molecular dynamics; Sputtering

Indexed keywords

DEPOSITION; MOLECULAR DYNAMICS; MORPHOLOGY; SPUTTERING; THIN FILMS;

EID: 0037080496     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01445-1     Document Type: Article
Times cited : (13)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.