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Volumn 149, Issue 2-3, 2002, Pages 135-142
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A molecular dynamics study of deposition rate dependence of film morphology in the sputtering process
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Author keywords
Deposition rate; Incident energy; Molecular dynamics; Sputtering
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Indexed keywords
DEPOSITION;
MOLECULAR DYNAMICS;
MORPHOLOGY;
SPUTTERING;
THIN FILMS;
SHORT-DISTANCE COLLISON;
COATINGS;
DEPOSITION;
FILM;
MATHEMATICAL MODELING;
MORPHOLOGY;
SPUTTERING;
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EID: 0037080496
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(01)01445-1 Document Type: Article |
Times cited : (13)
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References (41)
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