Investigations of local surface properties by SNOM combined with KFM using a PZT cantilever

IEICE Transactions on Electronics

Volumn E85-C, Issue 12 SPEC., 2002, Pages 2071-2076

  Satoh, Nobuo ^a   Watanabe, Shunji ^b   Fujii, Toru ^b   Kobayashi, Kei ^b   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

^b NIKON CORPORATION   (Japan)

Author keywords

FM detection; KFM; PZT cantilever; SNOM

Indexed keywords

CANTILEVER BEAMS; ELECTRIC PROPERTIES; ELECTROSTATICS; FERROELECTRIC THIN FILMS; FREQUENCY MODULATION; GLASS; LATEXES; LEAD COMPOUNDS; POLYVINYL ALCOHOLS; SENSORS; SURFACE PROPERTIES; THIN FILMS;

FREQUENCY MODULATION DETECTION; KELVIN FORCE MICROSCOPY; LEAD ZIRCONATE TITANATE CANTILEVER;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0037003855     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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