Improvement of ramp-surface morphology for interface-engineered junction

Physica C: Superconductivity and its Applications

Volumn 378-381, Issue PART 2, 2002, Pages 1362-1367

  Horibe, M ^a   Suzuki, T ^a,b   Tano, H ^a,b   Wakana, H ^a   Ishimaru, Y ^a   Adachi, S ^a   Horibe, O ^a   Tarutani, Y ^a   Tanabe, K ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^b CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Interface engineered junctions; Mechanical polishing; Ramp surface morphology; Uniform ion beam

Indexed keywords

ELECTRIC POTENTIAL; ELECTRODES; ETCHING; INTERFACES (MATERIALS); ION SOURCES; MORPHOLOGY; POLISHING; SPUTTERING; SUPERCONDUCTING FILMS; SURFACE ROUGHNESS; YTTRIUM BARIUM COPPER OXIDES;

RAMP-SURFACE MORPHOLOGY; UNIFORM-BEAM ETCHING;

JOSEPHSON JUNCTION DEVICES;

EID: 0036789125     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)01715-X     Document Type: Article

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