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Volumn 11, Issue 1 I, 2001, Pages 163-166
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Investigation of ramp-type Josephson junctions with surface-modified barriers
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HITACHI LTD
(Japan)
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Author keywords
Barrier thickness; Dielectric constant; High temperature superconductor; Interface engineered junction; McCumber parameter; Ramp edge
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Indexed keywords
RAMP-TYPE JOSEPHSON JUNCTIONS;
STRAY CAPACITANCE;
SURFACE MODIFIED BARRIERS;
CAPACITANCE;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CURRENT VOLTAGE CHARACTERISTICS;
HIGH TEMPERATURE SUPERCONDUCTORS;
INTERFACES (MATERIALS);
IRRADIATION;
PERMITTIVITY;
REACTIVE ION ETCHING;
SURFACE TREATMENT;
JOSEPHSON JUNCTION DEVICES;
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EID: 0035268734
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/77.919310 Document Type: Conference Paper |
Times cited : (35)
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References (11)
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