High-temperature superconducting edge-type Josephson junctions with modified interface barriers

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 770-775

  Satoh, Tetsuro ^a   Wen, Jian Guo ^b   Hidaka, Mutsuo ^a   Tahara, Shuichi ^a   Koshizuka, Naoki ^b   Tanaka, Shoji ^b  

^a NEC CORPORATION   (Japan)

^b SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

Fabrication; High temperature superconductors; Josephson junctions; Surface treatment

Indexed keywords

ANNEALING; CRITICAL CURRENTS; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; INTERFACES (MATERIALS); SUPERCONDUCTING DEVICES; SURFACE TREATMENT; YTTRIUM BARIUM COPPER OXIDES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACE BARRIERS; ION IRRADIATION;

JOSEPHSON JUNCTION DEVICES;

EID: 0035268344     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919459     Document Type: Conference Paper

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