Effect of microstructure on the electrical properties of YBCO interface-engineered Josephson junctions

Physica C: Superconductivity and its Applications

Volumn 314, Issue 1, 1999, Pages 36-42

  Huang, Y ^a   Merkle, K L ^a   Moeckly, B H ^b   Char, K ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b W 969 Maude Ave ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; EPITAXIAL GROWTH; INTERFACES (MATERIALS); JOSEPHSON JUNCTION DEVICES; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

HETEROPHASE LAYERS; INTERFACE ENGINEERED JUNCTIONS;

OXIDE SUPERCONDUCTORS;

EID: 0032678199     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(99)00028-3     Document Type: Article

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