Effects of process parameters on the fabrication of edge-type YBCO Josephson junctions by interface treatments

Physica C: Superconductivity and its Applications

Volumn 326, Issue , 1999, Pages 157-169

  Heinsohn, J K ^a   Hadfield, R H ^a   Dittmann, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEPOSITION; ELECTRIC CONTACTS; INTERFACES (MATERIALS); JOSEPHSON JUNCTION DEVICES; OXIDE SUPERCONDUCTORS; REGRESSION ANALYSIS; THERMAL EFFECTS; YTTRIUM BARIUM COPPER OXIDES;

INTERFACE TREATMENT; MULTIPLE REGRESSION;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0033323765     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(99)00416-5     Document Type: Article

References (26)

1. Verhoeven M.A.J., Moerman R., Bijlsma M.E., Rijnders A.J.H.M., Blank D.H.A., Gerritsma G.J., Rogalla H. Appl. Phys. Lett. 68:1996;1276.
2. de Gennes P.G. Rev. Mod. Phys. 36:1964;225.
3. Likharev K.H. Sov. Tech. Phys. Lett. 2:1976;12.
4. Moeckly B.H., Char K. Appl. Phys. Lett. 71:1997;2526.
5. B.D. Hunt, M.G. Forrester, J. Talvacchio, R.M. Young, IEEE Trans. Appl. Supercond., in press.
6. A. Fujimaki, K. Kawai, N. Hayashi, M. Horibe, M. Maruyama, H. Hayakawa, IEEE Trans. Appl. Supercond., in press.
7. T. Satoh, M. Hidaka, S. Tahara, IEEE Trans. Appl. Supercond., in press.
8. R. Dittmann, J.-K. Heinsohn, A.I. Braginski, IEEE Trans. Appl. Supercond., in press.
9. Jia C.L., Faley M.I., Poppe U., Urban K. Appl. Phys. Lett. 67:1995;3635.
10. Huang Y., Merkle K.L., Moeckly B.H., Char K. Physica C. 314:1999;36.
11. Kupryanov M.Yu. Sov. J. Low Temp. Phys. 7:1981;342.
12. Heinsohn J.-K., Reimer D., Richter A., Subke K.-O., Schilling M. Physica C. 299:1998;99.
13. Clark J.H., Donaldson G.B., Bowman R.M. IEEE Trans. Appl. Supercond. 5:1995;1661.
14. Knappe S., Elster C., Koch H. J. Vac. Sci. Technol. A. 15:1997;2158.
15. Petiette-Hall C.L., Murduck J., Burch J.F., Sergant M., Hu R., Cordromp J., Luong M., Ellis R.K. IEEE Trans. Appl. Supercond. 7:1997;2057.
16. C.L. Petiette-Hall, J. Murduck, J.F. Burch, M. Sergant, R. Hu, J. Cordromp, H. Aquilino, IEEE Trans. Appl. Supercond., in press.
17. Horstmann C., Leinenbach P., Engelhardt A., Gerber R., Jia C.L., Dittmann R., Memmert U., Hartmann U., Braginski A.I. Physica C. 302:1998;176.
18. G.E.P. Box, W.G. Hunter, J.S. Hunter, Statistics for Experimenters, Wiley, New York, 1978.
19. G.E.P. Box, N.R. Draper, Empirical Model-Building and Response Surfaces, Wiley, New York, 1987.
20. Statistica, (c) StatSoft, 1997.
21. Agostinelli J.A., Chen S., Braunstein G. Phys. Rev. B. 43:1990;13.
22. Tinchev S.S. IEEE Trans. Appl. Supercond. 3:1993;28.
23. Kahlmann F., Engelhardt A., Schubert J., Zander W., Buchal Ch., Hollkott J. Appl. Phys. Lett. 73:1998;16.
24. Booij W.E., Pauza A.J., Tarte E.J., Moore D.F., Blamire M.G. Phys. Rev. B. 55:1997;16400.
25. Davidson B.A., Nordman J.E., Hinaus B.M., Rzchowski M.S., Siangchaew K., Libera M. Appl. Phys. Lett. 68:1996;3811.
26. Legris A., Rullier-Albenque F., Radeva E., Lejay P. J. Phys. I. 3:1993;1605.