Atomic structure and composition of the barrier in the modified interface high-Tc Josephson junction studied by transmission electron microscopy

Applied Physics Letters

Volumn 75, Issue 16, 1999, Pages 2470-2472

  Wen, J G ^a   Koshizuka, N ^a   Tanaka, S ^a   Satoh, T ^b   Hidaka, M ^b   Tahara, S ^b  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^b NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000598482     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125051     Document Type: Article

References (14)

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