Improvement of the Sandwich Junction Properties by Planarization of YBCO Films

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3456-3459

  Maruyama, Michitaka ^a   Yoshida, Kazuhiro ^a   Horibe, Masahiro ^a   Fujimaki, Akira ^a   Hayakawa, Hisao ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ETCHING; OXIDE SUPERCONDUCTORS; SUPERCONDUCTING FILMS; SURFACE ROUGHNESS; YTTRIUM BARIUM COPPER OXIDES;

FILM ROUGHNESS; INTERLAYERS; PLANARIZATION; ROOT MEAN SQUARE VALUE; TRILAYER JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0032660515     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783773     Document Type: Article

References (8)

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