Electromechanical instability of microscale structures

Journal of Applied Physics

Volumn 92, Issue 5, 2002, Pages 2789-2794

  Yang, Fuqian ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSED FORM SOLUTIONS; CONTACT LENGTH; CONTACT PROBLEM; CRITICAL VALUE; ELASTIC-MEMBRANE THEORY; ELECTRIC VOLTAGE; ELECTROMECHANICAL INSTABILITY; ELECTROMECHANICAL INTERACTIONS; EQUILIBRIUM STATE; FAILURE MECHANISM; INITIALLY STRESS; LINE FORCES; MECHANICAL DEFORMATION; MEMS-STRUCTURE; MICRO-SCALE STRUCTURES; MICRO-SCALES; PULL-IN; PULL-IN INSTABILITY; RESIDUAL LINES; SQUARE ROOTS; TENSILE FORCES;

ELECTRIC FIELDS; ELECTROMECHANICAL DEVICES; LOADING; MEMS;

MEMBRANES;

EID: 0036735522     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1496123     Document Type: Article

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