Statistical threshold formulation for dynamic I dd test

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 21, Issue 6, 2002, Pages 694-705

  Jiang, Wanli ^a,b   Vinnakota, Bapiraju ^c  

^a IEEE   (United States)

^b BOSTON SCIENTIFIC CORPORATION   (United States)

^c University of Minnesota   (United States)

Author keywords

Dynamic current test; MOSFET modeling; Principal component analysis; Process variation; Threshold

Indexed keywords

DYNAMIC CURRENT TESTS;

ELECTRIC CURRENTS; ENERGY UTILIZATION; FAULT TREE ANALYSIS; MOSFET DEVICES; PRINCIPAL COMPONENT ANALYSIS; STATISTICAL TESTS;

CMOS INTEGRATED CIRCUITS;

EID: 0036608829     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2002.1004313     Document Type: Article

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