Deep submicron defect detection with the energy consumption ratio

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1999, Pages 467-470

  Vinnakota, Bapiraju ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DEFECTS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; ELECTRIC POWER SUPPLIES TO APPARATUS; ERROR DETECTION; VECTORS;

DEEP SUBMICRON DEFECT DETECTION; ENERGY CONSUMPTION RATIO;

INTEGRATED CIRCUIT TESTING;

EID: 0033318407     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)