High resolution IDDQ characterization and testing - practical issues

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 259-268

  Righter, Alan W ^a   Soden, Jerry M ^a   Beegle, Richard W ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; CMOS INTEGRATED CIRCUITS; COMPUTER HARDWARE; COMPUTER SOFTWARE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FAULT CURRENTS; STATISTICAL METHODS;

OFF STATE CURRENT;

INTEGRATED CIRCUIT TESTING;

EID: 0030384603     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)