Orbital alignment at p-sexiphenyl and coronene/layered materials interfaces measured with photoemission spectroscopy

Journal of Applied Physics

Volumn 91, Issue 11, 2002, Pages 9095-9107

  Schroeder, P G ^a   France, C B ^a   Parkinson, B A ^a   Schlaf, R ^b  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; CORONENE; EMISSION LINES; ENERGY LEVEL ALIGNMENT; GROWTH STEPS; HIGHEST OCCUPIED MOLECULAR ORBITAL; IN-SITU; INERT SURFACES; INTERFACE DIPOLE; LOW-INTENSITY; ORGANIC MOLECULES; ORGANIC THIN FILMS; P-SEXIPHENYL; PARA-SEXIPHENYL; POLARIZATION ENERGY; PYROLYTIC GRAPHITE; SCREENING EFFECT; THIN-FILM DEPOSITIONS; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY; WORK FUNCTION MEASUREMENTS;

BINDING ENERGY; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; QUANTUM CHEMISTRY; SUBSTRATES; THIN FILMS; WORK FUNCTION; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 0036607924     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1473217     Document Type: Article

References (54)

1. C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987). apl APPLAB 0003-6951
2. J. R. Sheats, H. Antoniadis, M. Hueschen, W. Leonard, J. Miller, R. Moon, D. Roitman, and A. Stocking, Science 273, 884 (1996). sci SCIEAS 0036-8075
3. H. E. Katz and Z. Bao, J. Phys. Chem. B 104, 671 (2000). bfk JPCBFK 1089-5647
4. R. Schlaf, P. G. Schroeder, M. W. Nelson, B. A. Parkinson, P. A. Lee, K. W. Nebesny, and N. R. Armstrong, J. Appl. Phys. 86, 1499 (1999). jap JAPIAU 0021-8979
5. R. Schlaf, C. D. Merritt, L. A. Crisafulli, and Z. H. Kafafi, J. Appl. Phys. 86, 5678 (1999). jap JAPIAU 0021-8979
6. R. Schlaf, B. A. Parkinson, P. A. Lee, K. W. Nebesny, and N. R. Armstrong, J. Phys. Chem. B 103, 2984 (1999). bfk JPCBFK 1089-5647
7. P. G. Schroeder, M. W. Nelson, B. A. Parkinson, and R. Schlaf, Surf. Sci. 459, 349 (2000). sus SUSCAS 0039-6028
8. Y. Park, V. Choong, E. Ettedgui, Y. Gao, B. R. Hsieh, T. Wehrmeister, and K. Mullen, Appl. Phys. Lett. 69, 1080 (1996). apl APPLAB 0003-6951
9. H. Ishii, H. Oji, E. Ito, N. Hayashi, D. Yoshimura, and K. Seki, J. Lumin. 87-89, 61 (2000). jlu JLUMA8 0022-2313
10. G. Koller, R. I. R. Blyth, S. A. Sardar, F. P. Netzer, and M. G. Ramsey, Appl. Phys. Lett. 76, 927 (2000). apl APPLAB 0003-6951
11. I. G. Hill, A. Rajagopal, A. Kahn, and Y. Hu, Appl. Phys. Lett. 73, 662 (1998). apl APPLAB 0003-6951
12. A. Rajagopal, C. I. Wu, and A. Kahn, J. Appl. Phys. 83, 2649 (1998). jap JAPIAU 0021-8979
13. I. G. Hill, A. J. Mäkinen, and Z. H. Kafafi, Appl. Phys. Lett. 77, 1825 (2000). apl APPLAB 0003-6951
14. J. Ishii, K. Sugiyama, E. Ito, and K. Seki, Adv. Mater. 11, 605 (1999). amt ADVMEW 0935-9648
15. K. Horn, Appl. Phys. A: Solids Surf. 51, 289 (1990). apa APSFDB 0721-7250
16. R. Schlaf, O. Lang, C. Pettenkofer, and W. Jaegermann, J. Appl. Phys. 85, 2732 (1999). jap JAPIAU 0021-8979
17. J. R. Waldrop and R. W. Grant, Phys. Rev. Lett. 43, 1686 (1979). prl PRLTAO 0031-9007
18. E. Ito, H. Oji, N. Hayashi, H. Ishii, Y. Ouchi, and K. Seki, Appl. Surf. Sci. 175-176, 407 (2001). asu ASUSEE 0169-4332
19. W. Jaegermann and H. Tributsch, Prog. Surf. Sci. 29, 1 (1988). psu PSSFBP 0079-6816
20. W. Jaegermann, in Photoelectrochemistry and Photovoltaics of Layered Semiconductors, edited by A. Aruchamy (Kluwer Academic, Dordrecht, 1992).
21. G. Grem, G. Leditzky, B. Ullrich, and G. Leising, Adv. Mater. 4, 36 (1992). amt ADVMEW 0935-9648
22. G. Leising, S. Tasch, F. Meghdadi, L. Athouel, G. Froyer, and U. Scherf, Synth. Met. 81, 185 (1996). sym SYMEDZ 0379-6779
23. Y. Z. Wang, R. G. Sun, F. Meghdadi, G. Leising, and A. J. Epstein, Appl. Phys. Lett. 74, 3613 (1999). apl APPLAB 0003-6951
24. H. Yanagi and S. Okamoto, Appl. Phys. Lett. 71, 2563 (1997). apl APPLAB 0003-6951
25. A. Piaggi, G. Lanzani, G. Bongiovanni, A. Mura, W. Graupner, F. Meghdadi, G. Leising, and M. Nisoli, Phys. Rev. B 56, 10133 (1997). prb PRBMDO 0163-1829
26. K. A. Cho, T. Shimada, M. Sakurai, and A. Koma, J. Appl. Phys. 84, 268 (1998). jap JAPIAU 0021-8979
27. C. D. England, G. E. Collins, T. J. Schuerlein, and N. R. Armstrong, Langmuir 10, 2748 (1994). lan LANGD5 0743-7463
28. A. W. McKinnon, M. E. Welland, and S. J. D. Warren, Thin Solid Films 257, 63 (1995). tsf THSFAP 0040-6090
29. R. Schlaf, P. G. Schroeder, M. W. Nelson, B. A. Parkinson, C. D. Merritt, L. A. Crisafulli, H. Murata, and Z. H. Kafafi, Surf. Sci. 450, 142 (2000). sus SUSCAS 0039-6028
30. M. P. Seah, Surf. Interface Anal. 14, 488 (1989). sia SIANDQ 0142-2421
31. I. Kojima and M. Kurahashi, J. Electron Spectrosc. Relat. Phenom. 42, 177 (1987). jer JESRAW 0368-2048
32. N. Koch, L.-M. Yu, V. Parente, R. Lazzaroni, R. L. Johnson, G. Leising, J.-J. Pireauz, and J.-L. Bredas, Adv. Mater. 10, 1038 (1998). amt ADVMEW 0935-9648
33. A. Rajagopal and A. Kahn, Adv. Mater. 10, 130 (1998). amt ADVMEW 0935-9648
34. I. G. Hill, A. Rajagopal, and A. Kahn, J. Appl. Phys. 84, 3236 (1998). jap JAPIAU 0021-8979
35. K. Sugiyama, D. Yoshimura, T. Miyamae, T. Miyazaki, H. Ishii, Y. Ouchi, and K. Seki, J. Appl. Phys. 85, 4928 (1999). jap JAPIAU 0021-8979
36. S. Narioka et al., Appl. Phys. Lett. 67, 1899 (1995). apl APPLAB 0003-6951
37. M. Era, T. Tsutsui, and S. Saito, Appl. Phys. Lett. 67, 2436 (1995). apl APPLAB 0003-6951
38. T. Mikami and H. Yanagi, Appl. Phys. Lett. 73, 563 (1998). apl APPLAB 0003-6951
39. M. Pope and C. E. Swenberg, Electronic Processes in Organic Crystals and Polymers (Oxford University Press, Oxford, 1999).
40. R. S. Williams, P. S. Wehner, J. Stöhr, and D. A. Shirley, Phys. Rev. Lett. 39, 302 (1977). prl PRLTAO 0031-9007
41. N. O. Lipari, P. Nielsen, J. J. Ritsko, A. J. Epstein, and D. J. Sandman, Phys. Rev. B 14, 2229 (1976). prb PRBMDO 0163-1829
42. C. B. Duke, Surf. Sci. 70, 674 (1977). sus SUSCAS 0039-6028
43. M. Keil et al., J. Phys. Chem. B 104, 3967 (2000). bfk JPCBFK 1089-5647
44. G. Kaindl, T.-C. Chiang, D. E. Eastman, and F. J. Himpsel, Phys. Rev. Lett. 45, 1808 (1980). prl PRLTAO 0031-9007
45. K. Jacobi, Phys. Rev. B 38, 6291 (1988). prb PRBMDO 0163-1829
46. N. Sato, K. Seki, and H. Inokuchi, J. Chem. Soc., Faraday Trans. 2 77, 1621 (1981). jfz JCFTBS 0300-9238
47. K. Seki, Mol. Cryst. Liq. Cryst. 171, 255 (1989). mcl MCLCA5 0026-8941
48. T. Mandel, M. Domke, G. Kaindl, C. Laubschat, U. Middelmann, and K. Horn, Surf. Sci. 162, 453 (1985). sus SUSCAS 0039-6028
49. E. L. Benitez, M. L. Dark, D. E. Husk, S. E. Schnatterly, and C. Tarrio, Appl. Opt. 33, 1854 (1994). apo APOPAI 0003-6935
50. P. E. Laibinis, R. L. Graham, H. A. Biebuyck, and G. M. Whitesides, Science 254, 981 (1991). sci SCIEAS 0036-8075
51. M. Zharnikov, S. Frey, K. Heister, and M. Grunze, Langmuir 16, 2697 (2000). lan LANGD5 0743-7463
52. M. Zharnikov, S. Frey, A. Gölzhäuser, W. Geyer, and M. Grunze, Phys. Chem. 1, 3163 (1999). 97v PPCPFQ 1463-9076
53. K. Heister, M. Zharnikov, M. Grunze, L. S. O. Johansson, and A. Ulman, Langmuir 17, 8 (2001). lan LANGD5 0743-7463
54. C. Argile and G. E. Rhead, Surf. Sci. Rep. 10, 277 (1989). ssr SSREDI 0167-5729