Energy level alignment and band bending at model interfaces of organic electroluminescent devices

Journal of Luminescence

Volumn 87, Issue , 2000, Pages 61-65

  Ishii, H ^a   Oji, H ^a   Ito, E ^a   Hayashi, N ^a   Yoshimura, D ^a   Seki, K ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; FERMI LEVEL; INTERFACES (MATERIALS); MATHEMATICAL MODELS; METALS; ULTRAVIOLET SPECTROSCOPY;

KELVIN PROBE METHOD; MOTT-SCHOTTKY MODEL; ORGANIC ELECTROLUMINESCENT DEVICES; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY;

LUMINESCENT DEVICES;

EID: 0033728099     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2313(99)00230-6     Document Type: Article

References (22)

1. R. Mönch, Surf. Sci. 299/300 (1994) 928 and references therein.
2. Narioka S., Ishii H., Yoshimura D., Sei M., Ouchi Y., Seki K., Hasegawa S., Miyazaki T., Harima Y., Yamashita K. Appl. Phys. Lett. 67:1995;1899.
3. Seki K., Tani T., Ishii H. Thin Solid Films. 273:1996;20.
4. Yoshimura D., Ishii H., Narioka S., Sei M., Miyazaki T., Ouchi Y., Hasegawa S., Harima Y., Yamashita K., Seki K. Synth. Met. 86:1997;2399.
5. Ishii H., Hasegawa S., Yoshimura D., Sugiyama K., Narioka S., Sei M., Ouchi Y., Seki K., Harima Y., Yamashita K. Mol. Cryst. Liq. Cryst. 296:1997;427.
6. Ishii H., Seki K. IEEE Trans. Electron Dev. 44:1997;1295.
7. Sugiyama K., Yoshimura D., Ito E., Miyazaki T., Hamatani Y., Kawamoto I., Ishii H., Ouchi Y., Seki K. Synth. Met. 86:1997;2425.
8. Ishii H., Yoshimura D., Sugiyama K., Narioka S., Hamatani Y., Kawamoto I., Miyazaki T., Ouchi Y., Seki K. Synth. Met. 85:1997;1389.
9. Ishii H., Sugiyama K., Yoshimura D., Ito E., Ouchi Y., Seki K. IEEE J. Sel. Top. Quant. Electron. 4:1998;24.
10. Ito E., Oji H., Ishii H., Oichi K., Ouchi Y., Seki K. Chem. Phys. Lett. 287:1998;137.
11. Ishii H., Morikawa E., Tang S.J., Yoshimura D., Ito E., Okudaira K., Miyamae T., Hasegawa S., Sprunger P.T., Ueno N., Seki K., Saile V. J. Electr. Spect. Rel. Phen. 101-103:1999;559.
12. Ishii H., Sugiyama K., Ito E., Seki K. Advanced Mater. 11:1999;605.
13. Hill I.G., Rajagopal A., Kahn A., Hu Y. Appl. Phys. Lett. 73:1998;662.
14. Unpublished data.
15. Ohno T.R., Chen Y., Harvey S.E., Kroll G.H., Weaver J.H., Haufler R.E., Smalley R.E. Phys. Rev. B. 44:1991;13747.
16. Magnano E., Vandre S., Cepek C., Goldoni A., Laine A.D., Curro G.M., Santaniello A., Sancrotti M. Surf. Sci. 377-379:1997;1066.
17. Choong V.-E., Mason M.G., Tang C.W., Gao Y. Appl. Phys. Lett. 72:1998;2689.
18. H.J. Freund, H. Kuhlenbeck, in: W. Eberhardt (Ed.), Application of Synchrotron Radiation, Springer, Berlin, 1995, 9 and refernces therein.
19. Ettedgui E., Razafitrimo H., Gao Y., Hsieh B.R., Ruckman M.W. Synth. Met. 78:1996;247.
20. A. Zangwill, Physics at Surfaces, Cambridge University Press, Cambridge, pp. 185, 1988, and references therein.
21. Wandelt K., Hulse J.E. J. Chem. Phys. 80:1984;1340.
22. Sugiyama K., Yoshimura D., Miyamae T., Miyazaki T., Ishii H., Ouchi Y., Seki K. J. Appl. Phys. 83:1998;4928.