Organic semiconductor interfaces: Discrimination between charging and band bending related shifts in frontier orbital line-up measurements with photoemission spectroscopy

Journal of Applied Physics

Volumn 86, Issue 10, 1999, Pages 5678-5686

  Schlaf, R ^a,b   Merritt, C D ^b   Crisafulli, L A ^b   Kafafi, Z H ^b  

^a BINGHAMTON UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001497114     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371578     Document Type: Article

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