A new procedure for automatic high precision measurements of the position and width of bands in backscatter kikuchi patterns

Materials Science Forum

Volumn 273-275, Issue , 1998, Pages 201-208

  Lassen, N C Krieger ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Crystal Orientation; EBSD; Hough Transform; Image Processing; Pattern Recognition

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; MATHEMATICAL TRANSFORMATIONS; PATTERN RECOGNITION; POSITION MEASUREMENT; SCANNING ELECTRON MICROSCOPY;

BACKSCATTER KIKUCHI PATTERNS (BKP); ELECTRON BACKSCATTERING PATTERNS (EBSP); HOUGH TRANSFORM;

CRYSTAL ORIENTATION;

EID: 3743134056     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

References (13)

1. J.A. Venables & C.J. Harland, Philos. Mag. 27 (1973), p. 1193.
2. V. Randle, Microtexture Determination and Its Application (1992), The Institute of Materials, London.
3. S.I. Wright & B.L. Adams, Metall. Trans. A23 (1992), p. 759.
4. K. Kunze, S.I. Wright, B.L. Adams & D.J. Dingley, Textures Microstruct. 20 (1993), p. 41.
5. J.B. Burns, A.R. Hanson & E.M. Riseman, IEEE Trans. Pattern. Anal. Mach. Intell. 8 (1986), p.425.
6. N.C. Krieger Lassen, D. Juul Jensen & K. Conradsen, Scanning Microsc. 6 (1992), p. 115.
7. N.C. Krieger Lassen, Mater. Science Techn. 12 (1996), p. 837.
8. P.V.C. Hough, US Patent 3,069,654 (1962).
9. J. Illingworth & J. Kittler, Comput. Vision Graphics Image Process. 44 (1988), p. 87.
10. N.C. Krieger Lassen, J. Microsc. (1997), submitted.
11. th Int. Conf. Pattern Recogn. (1986), Paris, p. 498.
12. N.C. Krieger Lassen, J. Microsc. 181 (1996), p. 72.
13. N.C. Krieger Lassen, D. Juul Jensen, K. Conradsen, Mater. Sci. Forum, 157-162 (1994), p. 149.