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Journal of Non-Crystalline Solids

Volumn 303, Issue 1, 2002, Pages 114-122

Why model high-k dielectrics?

(1) Stoneham, A M a

a UNIVERSITY COLLEGE LONDON (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); PERMITTIVITY; SILICA; STOICHIOMETRY;

INTERMEDIATE LAYERS;

DIELECTRIC MATERIALS;

EID: 0036567813 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(02)00966-3 Document Type: Article

Times cited : (16)

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