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Volumn , Issue , 2002, Pages 122-129

Pin-joint design effect on the reliability of a polysilicon microengine

Author keywords

MEMS Reliability; MEMS Wear; MicroElectroMechanical System

Indexed keywords

ADHESION; POLYSILICON; PROTECTIVE COATINGS; RELIABILITY; SELF ASSEMBLY; STRESS ANALYSIS; SUPERCRITICAL FLUIDS;

EID: 0036085611     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (23)
  • 15
    • 0002744537 scopus 로고    scopus 로고
    • MEMS reliability: Infrastructure, test structures, experiments, and failure modes
    • January, Download from
    • (2000) Sandia Report , vol.SAND2000-0091 , pp. 155-157
    • Tanner, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.