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Volumn 75, Issue 5, 2002, Pages 1011-1018
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Developing vibrational infrared near field spectroscopy to characterize polymer structures on surfaces: Identification and reduction of topographic coupling artifacts
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FIELD EMISSION MICROSCOPES;
INFRARED SPECTROSCOPY;
OPTICAL RESOLVING POWER;
SURFACE PROPERTIES;
OPTICAL SIGNALS;
POLYMERS;
POLYMER;
ARTICLE;
ARTIFACT REDUCTION;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
GEOMETRY;
IMAGE QUALITY;
INFRARED SPECTROSCOPY;
MATHEMATICAL MODEL;
OPTICAL RESOLUTION;
RADIATION SCATTERING;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
TOPOGRAPHY;
VIBRATION;
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EID: 0036081939
PISSN: 00092673
EISSN: None
Source Type: Journal
DOI: 10.1246/bcsj.75.1011 Document Type: Article |
Times cited : (2)
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References (35)
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