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Surface Science

Volumn 495, Issue 1-2, 2001, Pages 153-172

Optimization of conventional ellipsometric setups for determining the dielectric tensor of arbitrarily anisotropic systems

(3) Xu, W a Wood, L T a Golding, T D a

a University of Houston (United States)

Author keywords

Computer simulations; Ellipsometry; Superlattices

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; DIELECTRIC PROPERTIES; ELLIPSOMETRY; MOLECULAR BEAM EPITAXY; NUMERICAL ANALYSIS; SUPERLATTICES; THICK FILMS;

AZIMUTH ANGLE;

TENSORS;

EID: 0035842104 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01559-X Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.