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Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 362-367

A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7-x superconductors

(5) Michaelis, A a,c Irene, E A a Auciello, O b Krauss, A R b Veal, B b

a University of North Carolina at Chapel Hill (United States)

b ARGONNE NATIONAL LABORATORY (United States)

c IBM (United States)

Author keywords

Anisotropy; Spectroscopic anisotropy micro ellipsometry (SAME); YBa2Cu3O7 x

Indexed keywords

ANISOTROPY; CRYSTAL ORIENTATION; ELLIPSOMETRY; HIGH TEMPERATURE SUPERCONDUCTORS; ION BEAMS; OXIDE SUPERCONDUCTORS; REFRACTIVE INDEX; SINGLE CRYSTALS; SPUTTER DEPOSITION; STRONTIUM COMPOUNDS; ULTRAVIOLET SPECTROSCOPY; YTTRIUM COMPOUNDS;

ION BEAM SPUTTER DEPOSITION; SPECTROSCOPIC ANISOTROPY MICRO ELLIPSOMETRY (SAME); YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0032002332 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00847-X Document Type: Article

Times cited : (7)

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