Characterization of biaxially-stretched plastic films by generalized ellipsometry

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 814-818

  Elman, J F ^a   Greener, J ^a   Herzinger, C M ^b   Johs, B ^b  

^a EASTMAN KODAK COMPANY   (United States)

^b J A WOOLLAM CO INC   (United States)

Author keywords

Anisotropic; Ellipsometry; Plastic

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; LIGHT REFLECTION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; OPTICAL PROPERTIES; REGRESSION ANALYSIS;

BIAXIALLY STRETCHED PLASTIC FILMS; OPTIC AXIS ORIENTATION; OPTICAL CONSTANTS;

PLASTIC FILMS;

EID: 0031998640     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01001-8     Document Type: Article

References (4)

1. W.H. Press, B.P. Flannery, S.A. Teukolsky, W.T. Vetterling, Numerical Recipes in C, Cambridge University Press, Cambridge, 1988.
2. C.M. Herzinger, P.G. Snyder, B. Johs, J.A. Woollam, J. Appl. Phys. 77 (1995) 1715.
3. M. Schubert, Phys. Rev. B53 (1996) 4265.
4. M. Schubert, B. Rheinländer, J.A. Woollam, B. Johs, C.M. Herzinger, J. Opt. Soc. Am. A13 (1996) 875.