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Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 756-763

An anisotropy microellipsometry (AME) study of anodic film formation on Ti and Zr single grains

(2) Michaelis, A a Schweinsberg, M a

a HEINRICH HEINE UNIVERSITY (Germany)

Author keywords

Anisotropy; Epitaxy; Passive films; Titanium; Zirconium

Indexed keywords

AMORPHOUS FILMS; ANISOTROPY; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; ELLIPSOMETRY; FILM GROWTH; PASSIVATION; PHOTOREACTIVITY; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING FILMS; TITANIUM DIOXIDE; ZIRCONIA;

ANISOTROPY MICROELLIPSOMETRY (AME); PASSIVE FILMS;

PROTECTIVE COATINGS;

EID: 0032000544 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00992-9 Document Type: Article

Times cited : (8)

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