Ellipsometric method for the determination of the dielectric tensor of an optically uniaxial material suited for in-situ measurements

Thin Solid Films

Volumn 384, Issue 2, 2001, Pages 276-281

  Xu, W ^a,b   Wood, L T ^a   Golding, T D ^a,c  

^a University of Houston   (United States)

^b DigiBot Inc   (United States)

^c UNIVERSITY OF NORTH TEXAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DIELECTRIC MATERIALS; ELLIPSOMETRY; PHOTOMETRY; REFRACTIVE INDEX; TENSORS;

OPTICAL AXES; OPTICALLY UNIAXIAL MATERIALS;

OPTICAL MATERIALS;

EID: 0034831670     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01861-7     Document Type: Article

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