Electromigration-induced void drift and coalescence: Simulations and a dynamic scaling theory

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 14, 1997, Pages 8743-8751

  Crosby, Kevin M ^a   Bradley, R Mark ^a   Boularot, Hervé ^b  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b Analyt GmbH and Company KG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004872463     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.8743     Document Type: Article

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