Defect generation and diffusion mechanisms in Al and Al-Cu

Applied Physics Letters

Volumn 74, Issue 1, 1999, Pages 34-36

  Liu, C L ^a   Liu, X Y ^a   Borucki, L J ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22244449314     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123124     Document Type: Article

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