Background correction in scanning probe microscope recordings of macromolecules

Surface Science

Volumn 359, Issue 1-3, 1996, Pages 291-305

  Pascual Starink, J P ^a   Jovin, Thomas M ^b  

^a AmCell Corporation   (United States)

^b MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

Amorphous surfaces; Atomic force microscopy (AFM); Computer simulations; Glass surfaces; Physical adsorption; Scanning force microscopy (SFM); Scanning tunneling microscopy (STM); Surface structure, morphology, roughness, and topography

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; GLASS; MACROMOLECULES; MATHEMATICAL MODELS; MOLECULAR ORIENTATION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; SURFACE STRUCTURE; SURFACES;

AMORPHOUS SURFACES; SCANNING FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY;

SURFACE PHENOMENA;

EID: 0030190379     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00367-6     Document Type: Article

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